1985: G. Binnig, C.F. Quate and Ch. Gerber combined the scanning tunneling microscope (STM) with stylus profilometry (SP) to develop the atomic force microscope (AFM) [Phys. Rev. Lett., 56 (1986) 930]. This new microscopy system was developed as a logical evolution of the STM, invented four years earlier by Binnig and Gerber in collaboration with H. Rohrer and E. Weibel [Phys. Rev. Lett., 49 (1982) 57]. STM revolutionized the study of conducting species by producing surface images with unprecidented resolution. For their work regarding the STM, Binnig and Rohrer received the 1986 Nobel Prize in Physics (http://mirror.nobel.ki.se/laurates/physics-1986.html). Atomic force microscopy combines the ultrahigh resolution of STM with the insulator imaging capabilities of SP.